FTI Publications for Author: Whitley, J.B.
- coauthored while at: Sandia National Laboratory (2)
UWFDM-159 A Novel Method for Studying Damage Rate Effects in Ion Bombarded Nickel; J.B. Whitley, P. Wilkes, and G.L. Kulcinski, June 1976. (25 pages, 6.2 MB)
UWFDM-241 Defect Profile Calculations in an Ion Bombarded Foil; J.B. Whitley and G.L. Kulcinski, April 1977 (revised August 1984). (65 pages, 2.2 MB)
UWFDM-252 Effects of Bombarding Ions on the Void Swelling Profile in Nickel; J.B. Whitley, G.L. Kulcinski, H.V. Smith, Jr., and P. Wilkes, July 1978 [ASTM-STP-683, 125 (1979)]. (26 pages, 4.9 MB)
UWFDM-253 The Depth Dependent Damage Profile in Nickel Irradiated with Nickel or Copper Ions; J.B. Whitley, G.L. Kulcinski, P. Wilkes, and H.V. Smith, Jr., July 1978 [J. Nucl. Matls. 79, 159 (1979)]. (35 pages, 5.2 MB)
UWFDM-284 Depth Dependent Void Swelling Rates in Self-Ion Irradiated Nickel; J.B. Whitley, G.L. Kulcinski, P. Wilkes, and J. Billen, January 1979 [J. Nucl. Matls. 85 & 86, 701 (1979)]. (9 pages, 2.2 MB) [more]
UWFDM-275 Depth Dependent Damage in Heavy-Ion Irradiated Nickel; John Barry Whitley, August 1978 [Ph.D. thesis]. (226 pages, 26 MB)